package support;

import java.util.ArrayList;
import java.util.List;

/**
 * Factory methods for constructing test graph topologies.
 *
 * Each method returns a list of nodes ready to pass to GraphUtils.tarjan().
 * Topologies are chosen to stress the O(V²) defect in different ways.
 */
public class GraphFactory {

    /**
     * Path graph with a single back edge forming one large SCC:
     *   N0 → N1 → N2 → … → N(v-1) → N0
     *
     * Worst case for stack.contains(): when the back edge N(v-1)→N0 is
     * followed, the stack holds all V nodes. contains() must scan the
     * entire stack before finding N0 at the bottom.
     *
     * Total comparisons (defective):  V*(V+1)/2
     * Total comparisons (fixed):      V  (1 per edge)
     */
    public static List<AbstractTestNode> pathWithBackEdge(int v) {
        List<AbstractTestNode> nodes = new ArrayList<>();
        for (int i = 0; i < v; i++) {
            nodes.add(new AbstractTestNode("N" + i));
        }
        // forward edges
        for (int i = 0; i < v - 1; i++) {
            nodes.get(i).addDep(nodes.get(i + 1));
        }
        // single back edge
        nodes.get(v - 1).addDep(nodes.get(0));
        return nodes;
    }

    /**
     * Linear path (no cycles — no back edges):
     *   N0 → N1 → N2 → … → N(v-1)
     *
     * Every node is its own SCC. The stack at each step holds only nodes
     * whose SCC has not yet been closed. stack.contains() still fires for
     * each edge, scanning an average of V/2 entries.
     *
     * Total comparisons (defective):  O(V²) in the worst path pattern
     * Total comparisons (fixed):      O(E) = O(V)
     */
    public static List<AbstractTestNode> linearPath(int v) {
        List<AbstractTestNode> nodes = new ArrayList<>();
        for (int i = 0; i < v; i++) {
            nodes.add(new AbstractTestNode("N" + i));
        }
        for (int i = 0; i < v - 1; i++) {
            nodes.get(i).addDep(nodes.get(i + 1));
        }
        return nodes;
    }

    /**
     * k independent cycles, each of length cycleLen:
     *   [N0→N1→…→N(len-1)→N0], [N(len)→…], …
     *
     * Produces k SCCs of size cycleLen. Good for verifying correctness
     * of SCC counting and node grouping.
     */
    public static List<AbstractTestNode> independentCycles(int k, int cycleLen) {
        List<AbstractTestNode> all = new ArrayList<>();
        for (int c = 0; c < k; c++) {
            List<AbstractTestNode> cycle = new ArrayList<>();
            for (int i = 0; i < cycleLen; i++) {
                cycle.add(new AbstractTestNode("C" + c + "_N" + i));
            }
            for (int i = 0; i < cycleLen - 1; i++) {
                cycle.get(i).addDep(cycle.get(i + 1));
            }
            cycle.get(cycleLen - 1).addDep(cycle.get(0));
            all.addAll(cycle);
        }
        return all;
    }

    /**
     * Diamond graph with a cross edge:
     *   N0 → N1, N0 → N2, N1 → N3, N2 → N3
     * Plus an optional back edge N3 → N0.
     *
     * Used to verify that SCC detection handles multiple paths correctly.
     */
    public static List<AbstractTestNode> diamond(boolean withBackEdge) {
        AbstractTestNode n0 = new AbstractTestNode("N0");
        AbstractTestNode n1 = new AbstractTestNode("N1");
        AbstractTestNode n2 = new AbstractTestNode("N2");
        AbstractTestNode n3 = new AbstractTestNode("N3");
        n0.addDep(n1);
        n0.addDep(n2);
        n1.addDep(n3);
        n2.addDep(n3);
        if (withBackEdge) {
            n3.addDep(n0);
        }
        return List.of(n0, n1, n2, n3);
    }
}